
Accurate identification of hidden cracks, broken grids, black spots and color differences
Cell defects determine component Power and reliability. Machine vision uses AI algorithm to identify hidden cracks, broken grids, black spots and color differences, and combines EL/PL imaging to reveal internal defects to ensure the shipment quality of battery chips.

Identification of hidden cracks, broken grids, black spots, and color differences
AI Algorithm Platform accurately classifies defects
EL/PL imaging reveals internal defects
Multi-station linkage full inspection
Consistent sorting of silicon wafer line traces, chipping edges and thickness
Detection of battery cell layout misalignment and hidden crack defects before lamination
Electroluminescence and photoluminescence imaging reveals internal cracks
AI classification ensures consistency of component appearance color differences
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