Shenzhen Chuanghuayan Technology Co., Ltd.| HIKROBOT Machine Vision first-level agent in South China
Photovoltaic
Application ·Industry Applications

Photovoltaic ·Machine vision solution

Silicon wafer sorting, cell inspection, component layout and defect identification.

Silicon wafer sorting Cell crack detection Component typography defects EL/PL imaging Color difference recognition

Industry overview

OVERVIEW

covers the entire process of inspection of silicon wafers, cells and components, helping to improve the quality and efficiency of the Photovoltaic production line.

Silicon wafer sorting Cell crack detection Component typography defects EL/PL imaging Color difference recognition
Photovoltaic

Typical plan

TYPICAL SOLUTIONS
Total 1
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Photovoltaic cell chip testing

Hidden cracks, broken grids and color differences identification.

Integrate brightfield/darkfield imaging with AI algorithms to accurately identify cell cracks, broken grids and chromatic aberration defects.

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Excellent cases

SUCCESS CASES
Cell EL crack detection
Cases

Cell EL crack detection

Highly sensitive imaging identifies micro-cracks and broken grids to improve yield.

Component typography defect detection
Cases

Component typography defect detection

Online interception of typesetting mismatches and hidden cracks before lamination.

Silicon wafer surface inspection
Cases

Silicon wafer surface inspection

Line array imaging completes the automatic sorting of silicon wafer line traces and chipping edges.

Landing "Photovoltaic "Industry plan?
Provide selection consultation, sample testing and solution verification, and original factory authorization support.
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