
Electroluminescence and photoluminescence imaging reveals internal cracks
Electroluminescent (EL) and photoluminescent (PL) imaging are key means of revealing internal defects in Photovoltaic. Machine vision provides highly sensitive imaging and defect interpretation solutions to accurately locate internal defects such as cracks and black spots.

Highly sensitive EL/PL imaging solution
Accurate positioning of internal cracks and black spots
Adapt to different process beats
Linkage with the AI Interpretation Platform
Consistent sorting of silicon wafer line traces, chipping edges and thickness
Accurate identification of hidden cracks, broken grids, black spots and color differences
Detection of battery cell layout misalignment and hidden crack defects before lamination
AI classification ensures consistency of component appearance color differences
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