
High-speed detection of pin coplanarity, BGA ball placement and character AOI
Post-packaging determines chip reliability and solderability. Machine vision completes high-speed AOI inspection of pin coplanarity, BGA ball placement, characters and appearance, and adapts to multiple types of packages.

3D measurement of pin coplanarity
BGA ball implant missing ball and offset detection
Silkscreen characters and appearance AOI
AI Platform reduces false positives
Subpixel detection of wafer surface particles, scratches and lithography alignment
Lead frame positioning, coating defects and appearance identification
Telecentric Lenses + Custom Light Source enables fluoroscopic Distortion measurement
Complete complex defect determination based on self-developed algorithm Platform
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