Shenzhen Chuanghuayan Technology Co., Ltd.| HIKROBOT Machine Vision first-level agent in South China
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VM Algorithm Platform
APPLICATION · High-precision measurement

VM Algorithm Platform ·Machine vision solution

Complete complex defect determination based on self-developed algorithm Platform

Scene overview

OVERVIEW

Complex defect determination relies on a powerful algorithm Platform. Machine vision is based on the self-developed VM algorithm Platform to complete defect classification, measurement and logical arrangement, supporting the rapid deployment of multiple semiconductor scenarios.

Wafer defect detection Package alignment Lead frame positioning Subpixel measurement BGA ball planting detection
VM Algorithm Platform

Core competencies

KEY CAPABILITIES
1

Flexible orchestration of self-developed VM algorithm Platform

2

Classification and measurement of complex defects

3

Graphical rapid deployment

4

Overall plan for linkage with Industrial PCs

Recommended products

RECOMMENDED PRODUCTS
Smart AI Training & Inference Systems Smart Vision Systems Industrial PCs

Other application scenarios in the same industry

MORE SCENARIOS
Previous wafer

Subpixel detection of wafer surface particles, scratches and lithography alignment
Rear packaging

High-speed detection of pin coplanarity, BGA ball placement and character AOI
Lead frame

Lead frame positioning, coating defects and appearance identification
Telecentric imaging

Telecentric Lenses + Custom Light Source enables fluoroscopic Distortion measurement
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