
Telecentric Lenses + Custom Light Source enables fluoroscopic Distortion measurement
High-precision size measurement requires suppression of fluoroscopic Distortion. Machine vision uses Telecentric Lenses and customized Light Source to complete non-perspective Distortion measurement, adapting to the size and shape determination of precision components.

Telecentric Lenses Non-Fluoroscopic Distortion Imaging
Customized Light Source highlights edges and contours
Subpixel size measurement
Adapt precision component measurement
Subpixel detection of wafer surface particles, scratches and lithography alignment
High-speed detection of pin coplanarity, BGA ball placement and character AOI
Lead frame positioning, coating defects and appearance identification
Complete complex defect determination based on self-developed algorithm Platform
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